Inductively Coupled Plasma

Agilent 7850 ICP-MS

Highly sensitive analytical technique to measure multi-element concentrations from trace levels to major components. It uses an argon plasma as the ionization source and a single quadrupole mass spectrometer to detect and quantify positively charge ions in synthesized materials, geological samples, environmental matrices and biological specimens. 

ICP-MS coupled with HPLC enables speciation analysis, including differentiation of metal oxidation states and ionic forms.